Study of Conductive Textile Laminates by direct examination SEM method

Abstract

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by
scanning it with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals
that can be detected and that contain information about the sample's surface topography and composition. The electron
beam is generally scanned in a raster scan pattern, and the beam's position is combined with the detected signal to
produce an image. SEM can achieve resolution better than 1 nanometer. Specimens can be observed in hi gh vacuum, in
low vacuum, in wet conditions (in environmental SEM), and at a wide range of cryogenic or elevated temperatures. The
most common SEM mode is detection of secondary electrons emitted by atoms excited by the electron beam. In present
study, direct examination of conductive textile yarn and laminates through SEM is carried out to justify arrangement of
basic materials in final Laminates.