Effect of temperature on structure and dielectric, electrical properties of Al substituted BaY, Y-type Hexaferrites
Keywords:
Y type hexaferrites; Bulk density; X-ray density; Porosity; Chemical co-precipitation technique; XRDAbstract
In this paper structural, dielectric and electrical studies of Y-type hexaferrite (BaY) with Al substitution,
obtained by procedure of chemical co-precipitation method annealed at temperatures 1100°C for 4 and 6hrs and 1000°C
for 6hrs, is presented. The X-ray diffraction (XRD) analysis of the prepared sample confirmed the formation of single -
phase Y-type hexaferrites with space group R-3m having a parameter of hexagonal crystal structure. SEM micrograph
of the material shows a uniform distribution of nano sized grains throughout the surface of the samples. Detailed study of
the Electrical and dielectric properties of BaY, investigated in a wide frequency range (100 Hz to 10 MHz) at room
temperature by Wayn Kerr Impendence Precision Analyzer 6500B, showed that these properties are strongly dependent
on frequency and on the added level of the impurity.
The effect of temperatures and time on the properties of BaY hexaferrite was also studied.
