Structural and Dielectric properties of Ti doped Zn0.94Cd0.06O

Authors

  • Pallavi Saxena Materials Science Laboratory, School of Physics, Vigyan Bhavan, Devi Ahilya University, Khandwa Road Campus, Indore, 452001, India
  • M. S. Malla Materials Science Laboratory, School of Physics, Vigyan Bhavan, Devi Ahilya University, Khandwa Road Campus, Indore, 452001, India
  • P. Choudhary Materials Science Laboratory, School of Physics, Vigyan Bhavan, Devi Ahilya University, Khandwa Road Campus, Indore, 452001, India
  • Dinesh Varshney Materials Science Laboratory, School of Physics, Vigyan Bhavan, Devi Ahilya University, Khandwa Road Campus, Indore, 452001, India

Keywords:

Metal oxide, X-ray diffraction, Raman spectroscopy, Dielectric properties.

Abstract

Zn0.96Cd0.06-xTixO (x = 0.0, 0.3) nanoparticles were prepared by low temperature sol-gel auto combustion
method. XRD analysis reveals that the samples prepared are polycrystalline hexagonal wurtzite structure (with space
group P63mc). Slight variation in the lattice parameter of 3% Ti doped Zn0.96Cd0.06O has been observed due to the
difference in ionic radii of cations. The Raman spectra revel the seven active phonon modes. The phonon modes shift
towards higher wave number (blue shift) as Ti doped at Cd site, it might be due to the bond distribution in the samples.
The dielectric constant and loss shows decreasing trend and becomes constant at higher frequencies. The values of ε' and
tan δ is high (~13.8 and 27.5, respectively) at low-frequency region for Zn0.94Cd0.03Ti0.03O as compare to Zn0.94Cd0.06O.

Published

2022-08-23

How to Cite

Structural and Dielectric properties of Ti doped Zn0.94Cd0.06O. (2022). International Journal of Advance Engineering and Research Development (IJAERD), 4(17), -. https://ijaerd.org/index.php/IJAERD/article/view/6248

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